Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layer
Huang, Sheng-Yao, Chang, Ting-Chang, Chen, Min-Chen, Chen, Te-Chih, Jian, Fu-Yen, Chen, Yu-Chun, Huang, Hui-Chun, Gan, Der-ShinVolume:
231
Language:
english
Journal:
Surface and Coatings Technology
DOI:
10.1016/j.surfcoat.2011.12.047
Date:
September, 2013
File:
PDF, 1.02 MB
english, 2013