Growth-related structural defects in seeded sublimation-grown SiC
Tuominen, M., Yakimova, R., Prieur, E., Ellison, A., Tuomi, T., Vehanen, A., Janzén, E.Volume:
6
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(97)00096-4
Date:
August, 1997
File:
PDF, 834 KB
english, 1997