Lattice Defects in O +...

Japanese Journal of Applied Physics 1993 / 9 Vol. 32; Iss. Part 2, No

Lattice Defects in O + Implanted Tin-Doped Indium Oxide Films

Shigesato, Yuzo, Paine, David C., Haynes, T. E.
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Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L1352
Date:
September, 1993
File:
PDF, 1.12 MB
1993
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