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A compact new-concept ellipsometer for accurate large scale...

A compact new-concept ellipsometer for accurate large scale thin film measurements

Koops, Richard, Sonin, Petro, van Veghel, Marijn, El Gawhary, Omar
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Volume:
16
Language:
english
Journal:
Journal of Optics
DOI:
10.1088/2040-8978/16/6/065701
Date:
June, 2014
File:
PDF, 858 KB
english, 2014
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