[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Modeling of fan failures in networking enclosures
Narasimhan, Susheela, Shankaran, Gokul, Basak, ShankarYear:
2012
Language:
english
DOI:
10.1109/STHERM.2012.6188856
File:
PDF, 891 KB
english, 2012