Thin Film Studied by X-Ray Anomalous Diffraction

Akao, T., Azuma, Y., Usuda, M., Nishihata, Y., Mizuki, J., Hamada, N., Hayashi, N., Terashima, T., Takano, M.

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Volume:

Language:

english

Journal:

Physical Review Letters

DOI:

10.1103/PhysRevLett.91.156405

Date:

October, 2003

File:

PDF, 156 KB

english, 2003

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