Trace Analysis || Organics at Surfaces, their Detection and...

Trace Analysis || Organics at Surfaces, their Detection and Analysis by Static Secondary Ion Mass Spectrometry [and Discussion]

A. J. Paul, J. C. Vickerman, M. Grasserbauer, K. E. Cooksey, R. F. C. Mantoura, B. Evans and W. J. Albery
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Volume:
333
Language:
english
Journal:
Philosophical Transactions: Physical Sciences and Engineering
DOI:
10.2307/76781
Date:
October, 1990
File:
PDF, 327 KB
english, 1990
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