Decision Analysis in Microelectronic Reliability: Optimal...

Decision Analysis in Microelectronic Reliability: Optimal Design and Packaging of a Diode Array

Boaz Ronen and Joseph S. Pliskin
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Volume:
29
Language:
english
Journal:
Operations Research
DOI:
10.2307/170018
Date:
March, 1981
File:
PDF, 367 KB
english, 1981
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