Special Issue on New Directions in Operations Management ||...

Special Issue on New Directions in Operations Management || Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-To-Lot Variability

Jihong Ou and Lawrence M. Wein
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Volume:
44
Language:
english
Journal:
Operations Research
DOI:
10.2307/171914
Date:
April, 1996
File:
PDF, 368 KB
english, 1996
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