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Design for testability of a 32-bit TRON microprocessor
Yasuyuki Nozuyama, Akira Nishimura, Jun IwamuraVolume:
13
Year:
1989
Language:
english
Pages:
11
DOI:
10.1016/0141-9331(89)90030-6
File:
PDF, 1.60 MB
english, 1989