Built-in test for VLSI — pseudorandom techniques: Bardell,...

Microprocessors and Microsystems 1989 Vol. 13; Iss. 1

Built-in test for VLSI — pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354

Colin Maunder
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Volume:
13
Year:
1989
Language:
english
DOI:
10.1016/0141-9331(89)90036-7
File:
PDF, 118 KB
english, 1989
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