Thickness Dependent Loss Function of Si with 0.14 eV Energy Resolution
M. Stöger-Pollach, C. Hebert, H.W. Zandbergen, P. SchattschneiderVolume:
6
Year:
2004
Language:
english
Pages:
3
DOI:
10.1002/adem.200400085
File:
PDF, 291 KB
english, 2004