Defects in plastically deformed semiconductors studied by...

Physical Review B 1993 / 5 Vol. 47; Iss. 20

Defects in plastically deformed semiconductors studied by positron annihilation: Silicon and germanium

Krause-Rehberg, R., Brohl, M., Leipner, H. S., Drost, Th., Polity, A., Beyer, U., Alexander, H.
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Volume:
47
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.47.13266
Date:
May, 1993
File:
PDF, 685 KB
english, 1993
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