Superresolution Microscopy on the Basis of Engineered Dark...

Superresolution Microscopy on the Basis of Engineered Dark States

Steinhauer, Christian, Forthmann, Carsten, Vogelsang, Jan, Tinnefeld, Philip
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Volume:
130
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja806590m
Date:
December, 2008
File:
PDF, 360 KB
english, 2008
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