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thin film studied by Raman scattering and x-ray diffraction
Yuzyuk, Yu. I., Simon, P., Zakharchenko, I. N., Alyoshin, V. A., Sviridov, E. V.Volume:
66
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.66.052103
Date:
August, 2002
File:
PDF, 79 KB
english, 2002