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Review and future prospects of low-voltage RAM circuits
Nakagome, Y., Horiguchi, M., Kawahara, T., Itoh, K.Volume:
47
Language:
english
Journal:
IBM Journal of Research and Development
DOI:
10.1147/rd.475.0525
Date:
September, 2003
File:
PDF, 303 KB
english, 2003