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[IEEE Factory Automation (ETFA 2009) - Palma de Mallorca, Spain (2009.09.22-2009.09.25)] 2009 IEEE Conference on Emerging Technologies & Factory Automation - Fault detection and identification method based on multivariate statistical techniques
Fuente, M.J., Garcia-Alvarez, D., Sainz-Palmero, G.I., Villegas, T.Year:
2009
Language:
english
DOI:
10.1109/ETFA.2009.5346998
File:
PDF, 819 KB
english, 2009