![](/img/cover-not-exists.png)
by low-energy electron microscopy and microprobe diffraction
Yeh, Po-Chun, Jin, Wencan, Zaki, Nader, Zhang, Datong, Sadowski, Jerzy T., Al-Mahboob, Abdullah, van der Zande, Arend M., Chenet, Daniel A., Dadap, Jerry I., Herman, Irving P., Sutter, Peter, Hone, JaVolume:
89
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.89.155408
Date:
April, 2014
File:
PDF, 3.36 MB
english, 2014