![](/img/cover-not-exists.png)
[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - AlGaN/GaNHEMT with High PAE and Breakdown Voltage Grown by Ammonia MBE
Pei, Y., Suh, C., Chu, R., Recht, F., Shen, L., Corrion, A., Poblenz, C., Speck, J., Mishra, U.K.Year:
2007
Language:
english
DOI:
10.1109/DRC.2007.4373683
File:
PDF, 917 KB
english, 2007