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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology
Niclass, C., Sergio, M., Charbon, E.Year:
2006
Language:
english
DOI:
10.1109/DATE.2006.243987
File:
PDF, 1.58 MB
english, 2006