![](/img/cover-not-exists.png)
A double exposure technique for speckle pattern interferometry
Butters, J N, Leendertz, J AVolume:
4
Language:
english
Journal:
Journal of Physics E: Scientific Instruments
DOI:
10.1088/0022-3735/4/4/004
Date:
April, 1971
File:
PDF, 318 KB
english, 1971