Broadband dielectric spectroscopy of oxidized porous silicon
Axelrod, Ekaterina, Urbach, Benayahu, Sa'ar, Amir, Feldman, YuriVolume:
39
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/39/7/S06
Date:
April, 2006
File:
PDF, 363 KB
english, 2006