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Statistical Raman Microscopy and Atomic Force Microscopy on Heterogeneous Graphene Obtained after Reduction of Graphene Oxide
Eigler, Siegfried, Hof, Ferdinand, Enzelberger-Heim, Michael, Grimm, Stefan, Müller, Paul, Hirsch, AndreasVolume:
118
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp500580g
Date:
April, 2014
File:
PDF, 7.90 MB
english, 2014