[IEEE 2010 IEEE CPMT Symposium Japan (Formerly VLSI...

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[IEEE 2010 IEEE CPMT Symposium Japan (Formerly VLSI Packaging Workshop of Japan) - Tokyo, Japan (2010.08.24-2010.08.26)] 2010 IEEE CPMT Symposium Japan - Vibration test durability on large BGA assemblies: Evaluation of reinforcement techniques

Berthou, Matthieu, Lu, H., Retailleau, P., Fremont, H., Guedon-Gracia, A., Davennel, C., Bailey, C.
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Year:
2010
Language:
english
DOI:
10.1109/CPMTSYMPJ.2010.5679536
File:
PDF, 573 KB
english, 2010
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