[IEEE IEEE 1997 IEEE 1997 International Symposium on Electromagnetic Compatibility Symposium Record - Austin, TX, USA (18-22 Aug. 1997)] IEEE 1997, EMC, Austin Style. IEEE 1997 International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.97CH36113) - Investigation on VLSIs' input ports susceptibility to conducted RF interference
Fiori, F., Benelli, S., Gaidano, G., Pozzolo, V.Year:
1997
Language:
english
DOI:
10.1109/ISEMC.1997.667697
File:
PDF, 311 KB
english, 1997