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Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level
Jesse, Stephen, Kumar, Amit, Arruda, Thomas M., Kim, Yunseok, Kalinin, Sergei V., Ciucci, FrancescoVolume:
37
Language:
english
Journal:
MRS Bulletin
DOI:
10.1557/mrs.2012.144
Date:
July, 2012
File:
PDF, 729 KB
english, 2012