Elemental analysis of thick obsidian samples by proton induced x-ray emission spectrometry
Duerden, Peter., Cohen, D. D., Clayton, Eric., Bird, J. R., Ambrose, W. R., Leach, B. F.Volume:
51
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac50050a014
Date:
December, 1979
File:
PDF, 535 KB
english, 1979