Direct Comparison of ZrO 2 and HfO 2 on Ge Substrate in Terms of the Realization of Ultrathin High-κ Gate Stacks
Kamata, Yoshiki, Kamimuta, Yuuichi, Ino, Tsunehiro, Nishiyama, AkiraVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.2323
Date:
April, 2005
File:
PDF, 482 KB
english, 2005