![](/img/cover-not-exists.png)
Refractometric sensors based on multimode interference in a thin-film coated single-mode–multimode–single-mode structure with reflection configuration
Villar, Ignacio Del, Socorro, Abian B., Corres, Jesus M., Arregui, Francisco J., Matias, Ignacio R.Volume:
53
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.53.003913
Date:
June, 2014
File:
PDF, 1.28 MB
english, 2014