High-resolution imaging and X-ray microanalysis in the...

Surface and Interface Analysis 2014 / 12 Vol. 46; Iss. 12-13

High-resolution imaging and X-ray microanalysis in the FE-SEM

Brodusch, Nicolas, Demers, Hendrix, Trudeau, Michel, Gauvin, Raynald
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5584
Date:
December, 2014
File:
PDF, 2.95 MB
english, 2014
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