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[IEEE 2013 IEEE Faible Tension Faible Consommation (FTFC) - Paris, France (2013.06.20-2013.06.21)] 2013 IEEE Faible Tension Faible Consommation - Embedded memory hierarchy exploration based on magnetic RAM
Cargnini, Luis Vitorio, Torres, Lionel, Brum, Raphael Martins, Senni, Sophiane, Sassatelli, GillesYear:
2013
Language:
english
DOI:
10.1109/FTFC.2013.6577780
File:
PDF, 778 KB
english, 2013