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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Schottky diode parameters extraction using two different methods
Aazou, Safae, Assaid, El MahdiYear:
2009
Language:
english
DOI:
10.1109/ICM.2009.5418642
File:
PDF, 506 KB
english, 2009