Electron-Trap and Hole-Trap Distributions in...

IEEE Transactions on Electron Devices 2013 / 02 Vol. 60; Iss. 2

Electron-Trap and Hole-Trap Distributions in Metal/Oxide/Nitride/Oxide/Silicon Structures

Ishida, Takeshi, Mine, Toshiyuki, Hisamoto, Digh, Shimamoto, Yasuhiro, Yamada, Ren-ichi
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2012.2235145
Date:
February, 2013
File:
PDF, 632 KB
english, 2013
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