A Simulation Study on Process Sensitivity of a Line Tunnel...

IEEE Transactions on Electron Devices 2013 / 03 Vol. 60; Iss. 3

A Simulation Study on Process Sensitivity of a Line Tunnel Field-Effect Transistor

Walke, Amey M., Vandenberghe, William G., Kao, Kuo-Hsing, Vandooren, Anne, Groeseneken, Guido
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2242201
Date:
March, 2013
File:
PDF, 1.43 MB
english, 2013
Conversion to is in progress
Conversion to is failed