Charge Migration along the DNA Duplex:  Hole versus...

Journal of the American Chemical Society 2008 / 01 Vol. 130; Iss. 4

Charge Migration along the DNA Duplex:  Hole versus Electron Transport

Elias, Benjamin, Shao, Fangwei, Barton, Jacqueline K.
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Volume:
130
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja710358p
Date:
January, 2008
File:
PDF, 66 KB
english, 2008
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