Noise Behavior of a 180 nm CMOS SOI Technology for Detector...

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Noise Behavior of a 180 nm CMOS SOI Technology for Detector Front-End Electronics

Re, Valerio, Gaioni, Luigi, Manghisoni, Massimo, Ratti, Lodovico, Speziali, Valeria, Traversi, Gianluca, Yarema, Ray
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2001082
Date:
August, 2008
File:
PDF, 264 KB
english, 2008
Conversion to is in progress
Conversion to is failed