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[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - A Comprehensive Code-Based Quality Model for Embedded Systems: Systematic Development and Validation by Industrial Projects
Mayr, Alois, Plosch, Reinhold, Klas, Michael, Lampasona, Constanza, Saft, MatthiasYear:
2012
Language:
english
DOI:
10.1109/ISSRE.2012.4
File:
PDF, 406 KB
english, 2012