Advanced Experimental and Simulation Approaches to Meet...

Advanced Experimental and Simulation Approaches to Meet Reliability Challenges of New Electronics Systems

Dietmar Vogel, Jürgen Auersperg, Bernd Michel
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Volume:
11
Year:
2009
Language:
english
Pages:
7
DOI:
10.1002/adem.200800330
File:
PDF, 871 KB
english, 2009
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