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Optical thickness measurement with multi-wavelength THz interferometry
Nguyen, T.D., Valera, J.D.R., Moore, A.J.Volume:
61
Language:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2014.04.007
Date:
October, 2014
File:
PDF, 340 KB
english, 2014