AFM imaging and fractal analysis of surface roughness of...

Applied Surface Science 2014 / 09 Vol. 312

AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates

Dallaeva, Dinara, Ţălu, Ştefan, Stach, Sebastian, Škarvada, Pavel, Tománek, Pavel, Grmela, Lubomír
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Volume:
312
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2014.05.086
Date:
September, 2014
File:
PDF, 1.97 MB
english, 2014
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