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Measuring thermal expansion using X-band persistent scatterer interferometry
Crosetto, Michele, Monserrat, Oriol, Cuevas-González, María, Devanthéry, Núria, Luzi, Guido, Crippa, BrunoVolume:
100
Language:
english
Journal:
ISPRS Journal of Photogrammetry and Remote Sensing
DOI:
10.1016/j.isprsjprs.2014.05.006
Date:
February, 2015
File:
PDF, 4.90 MB
english, 2015