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Temperature dependent electrical and dielectric properties of a metal/Dy2O3/n-GaAs (MOS) structure
Saghrouni, H., Jomni, S., Belgacem, W., Elghoul, N., Beji, L.Volume:
29
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2014.05.039
Date:
January, 2015
File:
PDF, 1.93 MB
english, 2015