X-ray diffraction studies of thin films and multilayer structures
Armin Segmüller, I.C. Noyan, V.S. SperiosuVolume:
18
Year:
1989
Language:
english
Pages:
46
DOI:
10.1016/0146-3535(89)90024-5
File:
PDF, 2.34 MB
english, 1989