X-ray diffraction studies of thin films and multilayer...

X-ray diffraction studies of thin films and multilayer structures

Armin Segmüller, I.C. Noyan, V.S. Speriosu
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Volume:
18
Year:
1989
Language:
english
Pages:
46
DOI:
10.1016/0146-3535(89)90024-5
File:
PDF, 2.34 MB
english, 1989
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