[IEEE 2010 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2010 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2010) - Washington, DC, USA (2010.10.13-2010.10.15)] 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR) - Classification of levees using polarimetric Synthetic Aperture Radar (SAR) imagery

Dabbiru, Lalitha, Aanstoos, James V., Younan, Nicolas H.
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Year:
2010
Language:
english
DOI:
10.1109/AIPR.2010.5759703
File:
PDF, 758 KB
english, 2010
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