[IEEE 2010 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2010) - Washington, DC, USA (2010.10.13-2010.10.15)] 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR) - Classification of levees using polarimetric Synthetic Aperture Radar (SAR) imagery
Dabbiru, Lalitha, Aanstoos, James V., Younan, Nicolas H.Year:
2010
Language:
english
DOI:
10.1109/AIPR.2010.5759703
File:
PDF, 758 KB
english, 2010