Electrical Characterization of GaP-Silicon Interface for...

IEEE Transactions on Electron Devices 2013 / 07 Vol. 60; Iss. 7

Electrical Characterization of GaP-Silicon Interface for Memory and Transistor Applications

Pal, Ashish, Nainani, Aneesh, Ye, Zhiyuan, Bao, Xinyu, Sanchez, Errol, Saraswat, Krishna C.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2264495
Date:
July, 2013
File:
PDF, 1.90 MB
english, 2013
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