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Detailed Analysis of the Role of Thin-${\rm HfO}_{2}$ Interfacial Layer in ${\rm Ge}_{2}{\rm Sb}_{2}{\rm Te}_{5}$-Based PCM
Hubert, Quentin, Jahan, Carine, Toffoli, Alain, Delaye, Vincent, Lafond, Dominique, Grampeix, Helen, de Salvo, BarbaraVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2264323
Date:
July, 2013
File:
PDF, 2.63 MB
english, 2013