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[IEEE Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98 - Beijing, China (21-23 Oct. 1998)] 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) - The total dose effect on two types of CMOS devices
Zhang Zheng-Xuam,, Lue Jin-Sheng,, Yuan Ron-Feng,, He Bao-Ping,, Jiang Jing-Ho,Year:
1998
Language:
english
DOI:
10.1109/ICSICT.1998.785797
File:
PDF, 213 KB
english, 1998