Investigation on the Direct Method for the Extraction of Semiconductor Material Parameters Using the EBIC Line Scan: Planar-Collector Configuration
Tan, Chee Chin, Ong, Vincent K. S., Radhakrishnan, K.Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2259170
Date:
July, 2013
File:
PDF, 1.29 MB
english, 2013