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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Radiation hardness aspects of advanced FinFET and UTBOX devices
Claeys, C., Aoulaiche, M., Simoen, E., Griffoni, A., Kobayashi, D., Mahatme, N. N., Reed, R. A., Schrimpf, R. D., Agopian, P. G. D., Martino, J. A.Year:
2012
Language:
english
DOI:
10.1109/SOI.2012.6404372
File:
PDF, 973 KB
english, 2012