Investigation of Reverse Leakage Characteristics of...

IEEE Electron Device Letters 2012 / 12 Vol. 33; Iss. 12

Investigation of Reverse Leakage Characteristics of InGaN/GaN Light-Emitting Diodes on Silicon

Kim, Jaekyun, Kim, Jun-Youn, Tak, Youngjo, Kim, Joosung, Hong, Hyun-Gi, Yang, Moonseung, Chae, Suhee, Park, Junghoon, Park, Youngsoo, Chung, U-In
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2012.2221153
Date:
December, 2012
File:
PDF, 282 KB
english, 2012
Conversion to is in progress
Conversion to is failed